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System Test and Diagnosis
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Authors, William R. Simpson and John W. SheppardKluwer Academic Publishers, Boston, 1994
System Test and Diagnosis is the first book on test and diagnosis at the system level. System level is defined as any aggregation of related elements that together form an entity of sufficient complexity for which it is impractical to treat all of the elements at the lowest level of detail. The ideas presented emphasize that it is possible to diagnose complex systems efficiently. Since the notion of system is hierarchical, these ideas are applicable to all levels. The philosophy of diagnosis is presented in the context of a model-based approach. The authors use the information flow model, a model that focuses on the information provided by the tests rather than the functions embedded in the system. Detailed algorithms are offered for evaluating system testability, performing efficient diagnosis, verifying and validating the models, and constructing an architecture for system maintenance. There is considerable discussion of several advanced algorithms not commonly available in existing diagnosis tools, including reasoning with inexact or uncertain test data, breaking large problems into manageable smaller problems, diagnosing systems with time-sensitive information and time-dependent tests, and learning from experience. System Test and Diagnosis has three parts: The first part provides motivation for careful development of the subject; the second part provides the tools necessary for analyzing system testability and computing diagnostic strategies; and the third part presents advanced topics in diagnosis. Several case studies are provided, including a single detailed case study. Smaller case studies describe experiences from actual applications of the methods discussed. The detailed case study walks the reader through a complete analysis of a system to illustrate the concepts and describe the analyses that are possible. All case studies are based upon real systems that have been modeled for the purposes of diagnosis. System Test and Diagnosis is the culmination of nearly twelve years of research into diagnosis modeling and its applications. It is designed as a primary reference for engineers and practitioners interested in system test and diagnosis. ContentsPart One: MotivationChapter 1: Introduction Chapter 2: Maintainability: A Historical Perspective Chapter 3: Field Diagnosis and Repair: The Problem Part Two: Analysis and ApplicationChapter 4: Bottom-Up Modeling for Diagnosis Chapter 5: System Level Analysis for Diagnosis Chapter 6: The Information Flow Model Chapter 7: System Level Diagnosis Chapter 8: Evaluating System Diagnosability Chapter 9: Verification and Validation Chapter 10: Architectures for System Diagnosis Part Three: Advanced TopicsChapter 11: Inexact Diagnosis Chapter 12: Partitioning Large Problems Chapter 13: Modeling Temporal Information Chapter 14: Adaptive Diagnosis Chapter 15: Diagnosis--Art versus Science ReferencesIndex |
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For more information, contact:
Kluwer Academic Publishers P.O. Box 358/Accord Station Hingham, MA 02018-0358 kluwer@world.std.com 617-871-6528 Fax: 617-871-6528 |
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